3

A semi-empirical model for electron mobility at the SiC/SiO2 interface

Year:
2002
Language:
english
File:
PDF, 122 KB
english, 2002
5

A time domain analysis of the charge pumping current

Year:
1988
Language:
english
File:
PDF, 643 KB
english, 1988
6

Response of MNOS Capacitors to Ionizing Radiation at 80°k

Year:
1978
Language:
english
File:
PDF, 1.48 MB
english, 1978